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Applied Measurement with jMetrik

By J. Patrick Meyer

To Be Published January 1st 2014 by Routledge

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      978-0-415-53197-9
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      978-0-415-53195-5
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    Name: Applied Measurement with jMetrik (Paperback) – Routledge 
    Description: By J. Patrick Meyer. Applied Measurement with jMetrik, J. Patrick Meyer, Assessment & Testing, Educational Research, Assessment
    Categories: Assessment & Testing, Educational Research, Assessment