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Applied Measurement with jMetrik

By J. Patrick Meyer

Routledge – 2014 – 149 pages

Purchasing Options:

  • Add to CartPaperback: $46.95
    978-0-415-53197-9
    June 24th 2014
  • Add to CartHardback: $160.00
    978-0-415-53195-5
    June 27th 2014

Description

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

Contents

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix

Author Bio

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Name: Applied Measurement with jMetrik (Paperback)Routledge 
Description: By J. Patrick Meyer. jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied...
Categories: Assessment & Testing, Educational Research, Assessment