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Electron Microscopy and Analysis, Third Edition

By Peter J. Goodhew, John Humphreys, Richard Beanland

CRC Press – 2000 – 254 pages

Purchasing Options:

  • INVD:
    978-1-42-001725-0
    November 29th 2000
    Out-of-print
  • Add to CartPaperback: $75.95
    978-0-7484-0968-6
    November 29th 2000

Description

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Name: Electron Microscopy and Analysis, Third Edition (Paperback)CRC Press 
Description: By Peter J. Goodhew, John Humphreys, Richard Beanland. Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and...
Categories: Materials Science, Optics & optoelectronics, Image Processing