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  1. Electron Microscopy and Analysis, Third Edition

    By Peter J. Goodhew, John Humphreys, Richard Beanland

    Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been...

    Published November 30th 2000 by CRC Press

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